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| k10p100m100sf2 k10 sub-family data sheet supports the following: MK10DN512ZVLL10 features ? operating characteristics C voltage range: 1.71 to 3.6 v C flash write voltage range: 1.71 to 3.6 v C temperature range (ambient): -40 to 105c ? performance C up to 100 mhz arm cortex-m4 core with dsp instructions delivering 1.25 dhrystone mips per mhz ? memories and memory interfaces C up to 512 kb program flash memory on non- flexmemory devices C up to 128 kb ram C serial programming interface (ezport) C flexbus external bus interface ? clocks C 3 to 32 mhz crystal oscillator C 32 khz crystal oscillator C multi-purpose clock generator ? system peripherals C multiple low-power modes to provide power optimization based on application requirements C memory protection unit with multi-master protection C 16-channel dma controller, supporting up to 63 request sources C external watchdog monitor C software watchdog C low-leakage wakeup unit ? security and integrity modules C hardware crc module to support fast cyclic redundancy checks C 128-bit unique identification (id) number per chip ? human-machine interface C low-power hardware touch sensor interface (tsi) C general-purpose input/output ? analog modules C two 16-bit sar adcs C programmable gain amplifier (pga) (up to x64) integrated into each adc C 12-bit dac C three analog comparators (cmp) containing a 6-bit dac and programmable reference input C voltage reference ? timers C programmable delay block C eight-channel motor control/general purpose/pwm timer C two 2-channel quadrature decoder/general purpose timers C periodic interrupt timers C 16-bit low-power timer C carrier modulator transmitter C real-time clock ? communication interfaces C two controller area network (can) modules C three spi modules C two i2c modules C five uart modules C secure digital host controller (sdhc) C i2s module freescale semiconductor document number: k10p100m100sf2 data sheet: technical data rev. 7, 02/2013 freescale reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. ? 2011C2013 freescale semiconductor, inc.
table of contents 1 ordering parts ........................................................................... 3 1.1 determining valid orderable parts...................................... 3 2 part identification ...................................................................... 3 2.1 description......................................................................... 3 2.2 format ............................................................................... 3 2.3 fields ................................................................................. 3 2.4 example ............................................................................ 4 3 terminology and guidelines ...................................................... 4 3.1 definition: operating requirement...................................... 4 3.2 definition: operating behavior ........................................... 5 3.3 definition: attribute ............................................................ 5 3.4 definition: rating ............................................................... 6 3.5 result of exceeding a rating .............................................. 6 3.6 relationship between ratings and operating requirements...................................................................... 6 3.7 guidelines for ratings and operating requirements............ 7 3.8 definition: typical value..................................................... 7 3.9 typical value conditions .................................................... 8 4 ratings ...................................................................................... 9 4.1 thermal handling ratings ................................................... 9 4.2 moisture handling ratings .................................................. 9 4.3 esd handling ratings ......................................................... 9 4.4 voltage and current operating ratings ............................... 9 5 general ..................................................................................... 10 5.1 ac electrical characteristics .............................................. 10 5.2 nonswitching electrical specifications ............................... 10 5.2.1 voltage and current operating requirements ......... 10 5.2.2 lvd and por operating requirements ................. 11 5.2.3 voltage and current operating behaviors .............. 12 5.2.4 power mode transition operating behaviors .......... 14 5.2.5 power consumption operating behaviors .............. 15 5.2.6 emc radiated emissions operating behaviors....... 18 5.2.7 designing with radiated emissions in mind ........... 19 5.2.8 capacitance attributes .......................................... 19 5.3 switching specifications..................................................... 19 5.3.1 device clock specifications ................................... 19 5.3.2 general switching specifications ........................... 19 5.4 thermal specifications ....................................................... 20 5.4.1 thermal operating requirements ........................... 20 5.4.2 thermal attributes ................................................. 21 6 peripheral operating requirements and behaviors .................... 22 6.1 core modules .................................................................... 22 6.1.1 debug trace timing specifications ......................... 22 6.1.2 jtag electricals .................................................... 22 6.2 system modules ................................................................ 25 6.3 clock modules ................................................................... 25 6.3.1 mcg specifications ............................................... 25 6.3.2 oscillator electrical specifications ......................... 27 6.3.3 32 khz oscillator electrical characteristics........... 30 6.4 memories and memory interfaces ..................................... 30 6.4.1 flash electrical specifications................................ 30 6.4.2 ezport switching specifications ............................ 32 6.4.3 flexbus switching specifications .......................... 33 6.5 security and integrity modules .......................................... 36 6.6 analog ............................................................................... 36 6.6.1 adc electrical specifications ................................. 36 6.6.2 cmp and 6-bit dac electrical specifications ......... 44 6.6.3 12-bit dac electrical characteristics ..................... 46 6.6.4 voltage reference electrical specifications ............ 49 6.7 timers................................................................................ 50 6.8 communication interfaces ................................................. 50 6.8.1 can switching specifications ................................ 50 6.8.2 dspi switching specifications (limited voltage range) .................................................................... 51 6.8.3 dspi switching specifications (full voltage range). 52 6.8.4 inter-integrated circuit interface (i2c) timing ........ 54 6.8.5 uart switching specifications .............................. 55 6.8.6 sdhc specifications ............................................. 55 6.8.7 i2s switching specifications .................................. 56 6.9 human-machine interfaces (hmi)...................................... 59 6.9.1 tsi electrical specifications ................................... 59 7 dimensions ............................................................................... 60 7.1 obtaining package dimensions ......................................... 60 8 pinout ........................................................................................ 60 8.1 k10 signal multiplexing and pin assignments .................. 60 8.2 k10 pinouts ....................................................................... 64 9 revision history ........................................................................ 65 k10 sub-family data sheet data sheet, rev. 7, 02/2013. 2 freescale semiconductor, inc. 1 ordering parts 1.1 determining valid orderable parts valid orderable part numbers are provided on the web. to determine the orderable part numbers for this device, go to freescale.com and perform a part number search for the following device numbers: pk10 and mk10 . 2 part identification 2.1 description part numbers for the chip have fields that identify the specific part. you can use the values of these fields to determine the specific part you have received. 2.2 format part numbers for this device have the following format: q k## a m fff r t pp cc n 2.3 fields this table lists the possible values for each field in the part number (not all combinations are valid): field description values q qualification status m = fully qualified, general market flow p = prequalification k## kinetis family k10 a key attribute d = cortex-m4 w/ dsp f = cortex-m4 w/ dsp and fpu m flash memory type n = program flash only x = program flash and flexmemory table continues on the next page... ordering parts k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. field description values fff program flash memory size 32 = 32 kb 64 = 64 kb 128 = 128 kb 256 = 256 kb 512 = 512 kb 1m0 = 1 mb 2m0 = 2 mb r silicon revision z = initial (blank) = main a = revision after main t temperature range (?c) v = 40 to 105 c = 40 to 85 pp package identifier fm = 32 qfn (5 mm x 5 mm) ft = 48 qfn (7 mm x 7 mm) lf = 48 lqfp (7 mm x 7 mm) lh = 64 lqfp (10 mm x 10 mm) mp = 64 mapbga (5 mm x 5 mm) lk = 80 lqfp (12 mm x 12 mm) ll = 100 lqfp (14 mm x 14 mm) mc = 121 mapbga (8 mm x 8 mm) lq = 144 lqfp (20 mm x 20 mm) md = 144 mapbga (13 mm x 13 mm) mj = 256 mapbga (17 mm x 17 mm) cc maximum cpu frequency (mhz) 5 = 50 mhz 7 = 72 mhz 10 = 100 mhz 12 = 120 mhz 15 = 150 mhz n packaging type r = tape and reel (blank) = trays 2.4 example this is an example part number: mk10dn512zvmd10 3 terminology and guidelines 3.1 definition: operating requirement an operating requirement is a speciied value or range o values or a technical characteristic that you must guarantee during operation to avoid incorrect operation and possibly decreasing the useul lie o the chip erminology and guidelines ubamily ata heet ata heet ev reescale emiconductor nc 3.1.1 example this is an example of an operating requirement: symbol description min. max. unit v dd 1.0 v core supply voltage 0.9 1.1 v 3.2 definition: operating behavior an operating behavior is a speciied value or range o values or a technical characteristic that are guaranteed during operation i you meet the operating requirements and any other speciied conditions ample his is an eample o an operating behavior ymbol escription in a nit igital o ea pullup pulldon current einition ttribute n attribute is a speciied value or range o values or a technical characteristic that are guaranteed regardless o hether you meet the operating requirements ample his is an eample o an attribute ymbol escription in a nit nput capacitance digital pins p erminology and guidelines ubamily ata heet ata heet ev reescale emiconductor nc 3.4 definition: rating a rating is a minimum or maimum value o a technical characteristic that i eceeded may cause permanent chip ailure operating ratings apply during operation o the chip handling ratings apply hen the chip is not poered ample his is an eample o an operating rating ymbol escription in a nit core supply voltage esult o eceeding a rating easured characteristic operating rating ailures in time ppm he lielihood o permanent chip ailure increases rapidly as soon as a characteristic begins to eceed one o its operating ratings erminology and guidelines ubamily ata heet ata heet ev reescale emiconductor nc 3.6 relationship between ratings and operating requirements typical value is a speciied value or a technical characteristic that ies ithin the range o values speciied by the operating behavior iven the typical manuacturing process is representative o that characteristic during operation hen you meet the typicalvalue conditions or other speciied conditions ypical values are provided as design guidelines and are neither tested nor guaranteed erminology and guidelines ubamily ata heet ata heet ev reescale emiconductor nc 3.8.1 example 1 this is an example of an operating behavior that includes a typical value: symbol description min. typ. max. unit i wp digital i/o weak pullup/pulldown current 10 70 130 a 3.8.2 example 2 this is an example of a chart that shows typical values for various voltage and temperature conditions: 0.90 0.95 1.00 1.05 1.10 0 500 1000 1500 2000 2500 3000 3500 4000 4500 5000 150 ?c 105 ?c 25 ?c 40 ?c v dd (v) i (?a) dd_stop t j 3.9 typical value conditions typical values assume you meet the following conditions (or other conditions as specified): symbol description value unit t a ambient temperature 25 ?c v dd 3.3 v supply voltage 3.3 v terminology and guidelines k10 sub-family data sheet data sheet, rev. 7, 02/2013. 8 freescale semiconductor, inc. 4 ratings 4.1 thermal handling ratings symbol description min. max. unit notes t stg storage temperature 55 150 ?c 1 t sdr solder temperature, lead-free 260 ?c 2 solder temperature, leaded 245 1. determined according to jedec standard jesd22-a103, high temperature storage life . 2. determined according to ipc/jedec standard j-std-020, moisture/reflow sensitivity classification for nonhermetic solid state surface mount devices . .2 moisture handling ratings symbol description min. max. unit notes msl moisture sensitivity level 1 1. determined according to ipc/jedec standard j-std-020, moisture/reflow sensitivity classification for nonhermetic solid state surface mount devices . . esd handling ratings symbol description min. max. unit notes v hbm electrostatic discharge voltage, human body model -2000 2000 v 1 v cdm electrostatic discharge voltage, charged-device model -500 500 v 2 i lat latch-up current at ambient temperature of 105c -100 100 ma 1. determined according to jedec standard jesd22-a11, electrostatic discharge (esd) sensitivity testing human body model (hbm) . 2. determined according to jedec standard jesd22-c101, field-induced charged-device model test method for electrostatic-discharge-withstand thresholds of microelectronic components . . determined according to jedec standard jesd, ic latch-up test . . voltage and current operating ratings ratings k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. symbol description min. max. unit v dd digital supply voltage 0.3 3.8 v i dd digital supply current 185 ma v dio digital input voltage (except reset, extal, and xtal) 0.3 5.5 v v aio analog 1 , reset, extal, and xtal input voltage 0.3 v dd + 0.3 v i d maximum current single pin limit (applies to all digital pins) 25 25 ma v dda analog supply voltage v dd 0.3 v dd + 0.3 v v bat rtc battery supply voltage 0.3 3.8 v 1. analog pins are defined as pins that do not have an associated general purpose i/o port function. 5 general 5.1 ac electrical characteristics unless otherwise specified, propagation delays are measured from the 50% to the 50% point, and rise and fall times are measured at the 20% and 80% points, as shown in the following figure. figure 1. input signal measurement reference all digital i/o switching characteristics assume: 1. output pins ? have c l =30pf loads, ? are configured for fast slew rate (portx_pcrn[sre]=0), and ? are configured for high drive strength (portx_pcrn[dse]=1) 2. input pins ? have their passive filter disabled (portx_pcrn[pfe]=0) 5.2 nonswitching electrical specifications general k10 sub-family data sheet data sheet, rev. 7, 02/2013. 10 freescale semiconductor, inc. 5.2.1 voltage and current operating requirements table 1. voltage and current operating requirements symbol description min. max. unit notes v dd supply voltage 1.71 3.6 v v dda analog supply voltage 1.71 3.6 v v dd v dda v dd -to-v dda differential voltage 0.1 0.1 v v ss v ssa v ss -to-v ssa differential voltage 0.1 0.1 v v bat rtc battery supply voltage 1.71 3.6 v v ih input high voltage 2.7 v ? v dd ? 3.6 v 1.7 v ? v dd ? 2.7 v 0.7 v dd 0.75 v dd v v v il input low voltage 2.7 v ? v dd ? 3.6 v 1.7 v ? v dd ? 2.7 v 0.35 v dd 0.3 v dd v v v hys input hysteresis 0.06 v dd v i icdio digital pin negative dc injection current single pin v in < v ss -0.3v -5 ma 1 i icaio analog 2 , extal, and xtal pin dc injection current single pin v in < v ss -0.3v (negative current injection) v in > v dd +0.3v (positive current injection) -5 +5 ma 3 i iccont contiguous pin dc injection current regional limit, includes sum of negative injection currents or sum of positive injection currents of 16 contiguous pins negative current injection positive current injection -25 +25 ma v odpu open drain pullup voltage level v dd v dd v 4 v ram v dd voltage required to retain ram 1.2 v v rfvbat v bat voltage required to retain the vbat register file v por_vbat v 1. all 5 v tolerant digital i/o pins are internally clamped to v ss through an esd protection diode. there is no diode connection to v dd . if v in is less than v dio_min , a current limiting resistor is required. the negative dc injection current limiting resistor is calculated as r=(v dio_min -v in )/|i icdio |. 2. analog pins are defined as pins that do not have an associated general purpose i/o port function. additionally, extal and xtal are analog pins. 3. all analog pins are internally clamped to v ss and v dd through esd protection diodes. if v in is less than v aio_min or greater than v aio_max , a current limiting resistor is required. the negative dc injection current limiting resistor is calculated as r=(v aio_min -v in )/|i icaio |. the positive injection current limiting resistor is calculated as r=(v in -v aio_max )/|i icaio |. select the larger of these two calculated resistances if the pin is exposed to positive and negative injection currents. 4. open drain outputs must be pulled to vdd. general k10 sub-family data sheet data sheet, rev. 7, 02/2013. freescale semiconductor, inc. 11 5.2.2 lvd and por operating requirements table 2. v dd supply lvd and por operating requirements symbol description min. typ. max. unit notes v por falling vdd por detect voltage 0.8 1.1 1.5 v v lvdh falling low-voltage detect threshold high range (lvdv=01) 2.48 2.56 2.64 v v lvw1h v lvw2h v lvw3h v lvw4h low-voltage warning thresholds high range level 1 falling (lvwv=00) level 2 falling (lvwv=01) level 3 falling (lvwv=10) level 4 falling (lvwv=11) 2.62 2.72 2.82 2.92 2.70 2.80 2.90 3.00 2.78 2.88 2.98 3.08 v v v v 1 v hysh low-voltage inhibit reset/recover hysteresis high range 80 mv v lvdl falling low-voltage detect threshold low range (lvdv=00) 1.54 1.60 1.66 v v lvw1l v lvw2l v lvw3l v lvw4l low-voltage warning thresholds low range level 1 falling (lvwv=00) level 2 falling (lvwv=01) level 3 falling (lvwv=10) level 4 falling (lvwv=11) 1.74 1.84 1.94 2.04 1.80 1.90 2.00 2.10 1.86 1.96 2.06 2.16 v v v v 1 v hysl low-voltage inhibit reset/recover hysteresis low range 60 mv v bg bandgap voltage reference 0.97 1.00 1.03 v t lpo internal low power oscillator period factory trimmed 900 1000 1100 ?s 1. rising thresholds are falling threshold + hysteresis voltage table 3. vbat power operating requirements symbol description min. typ. max. unit notes v por_vbat falling vbat supply por detect voltage 0.8 1.1 1.5 v general k10 sub-family data sheet data sheet, rev. 7, 02/2013. 12 freescale semiconductor, inc. 5.2.3 voltage and current operating behaviors table 4. voltage and current operating behaviors symbol description min. typ. 1 max. unit notes v oh output high voltage high drive strength 2.7 v ? v dd ? 3.6 v, i oh = -9ma 1.71 v ? v dd ? 2.7 v, i oh = -3ma v dd 0.5 v dd 0.5 v v output high voltage low drive strength 2.7 v ? v dd ? 3.6 v, i oh = -2ma 1.71 v ? v dd ? 2.7 v, i oh = -0.6ma v dd 0.5 v dd 0.5 v v i oht output high current total for all ports 100 ma v ol output low voltage high drive strength 2.7 v ? v dd ? 3.6 v, i ol = 9ma 1.71 v ? v dd ? 2.7 v, i ol = 3ma 0.5 0.5 v v 2 output low voltage low drive strength 2.7 v ? v dd ? 3.6 v, i ol = 2ma 1.71 v ? v dd ? 2.7 v, i ol = 0.6ma 0.5 0.5 v v i olt output low current total for all ports 100 ma i ina input leakage current, analog pins and digital pins configured as analog inputs v ss ? v in ? v dd all pins except extal32, xtal32, extal, xtal extal (pta18) and xtal (pta19) extal32, xtal32 0.002 0.004 0.075 0.5 1.5 10 ?a ?a ?a 3 , 4 i ind input leakage current, digital pins v ss ? v in ? v il all digital pins v in = v dd all digital pins except ptd7 ptd7 0.002 0.002 0.004 0.5 0.5 1 ?a ?a ?a 4 , 5 i ind input leakage current, digital pins v il < v in < v dd v dd = 3.6 v v dd = 3.0 v v dd = 2.5 v v dd = 1.7 v 18 12 8 3 26 49 13 6 ?a ?a ?a ?a 4 , 5 , 6 table continues on the next page... general k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. 1 table 4. voltage and current operating behaviors (continued) symbol description min. typ. 1 max. unit notes i ind input leakage current, digital pins v dd < v in < 5.5 v 1 50 ?a 4 , 5 z ind input impedance examples, digital pins v dd = 3.6 v v dd = 3.0 v v dd = 2.5 v v dd = 1.7 v 48 55 57 85 k? k? k? k? 4 , 7 r pu internal pullup resistors 20 35 50 k? 8 r pd internal pulldown resistors 20 35 50 k? 9 1. typical values characterized at 25?c and vdd = 3.6 v unless otherwise noted. 2. open drain outputs must be pulled to v dd . 3. analog pins are defined as pins that do not have an associated general purpose i/o port function. 4. digital pins have an associated gpio port function and have 5v tolerant inputs, except extal and xtal. 5. internal pull-up/pull-down resistors disabled. 6. characterized, not tested in production. 7. examples calculated using v il relation, v dd , and max i ind : z ind =v il /i ind . this is the impedance needed to pull a high signal to a level below v il due to leakage when v il < v in < v dd . these examples assume signal source low = 0 v. 8. measured at v dd supply voltage = v dd min and vinput = v ss 9. measured at v dd supply voltage = v dd min and vinput = v dd + digital input source z ind i ind 5.2.4 power mode transition operating behaviors all specifications except t por , and vllsx table 5. power mode transition operating behaviors symbol description min. max. unit notes t por after a por event, amount of time from the point v dd reaches 1.71 v to execution of the first instruction across the operating temperature range of the chip. v dd slew rate ? 5.7 kv/s v dd slew rate < 5.7 kv/s 300 1.7 v / (v dd slew rate) ?s 1 vlls1 table continues on the next page... general k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. 15 table 6. power consumption operating behaviors (continued) symbol description min. typ. max. unit notes i dd_vlpr very-low-power run mode current at 3.0 v all peripheral clocks enabled n/a ma 7 i dd_vlpw very-low-power wait mode current at 3.0 v all peripheral clocks disabled n/a ma 8 i dd_stop stop mode current at 3.0 v @ 40 to 25?c @ 70?c @ 105?c 0.59 2.26 5.94 1.4 7.9 19.2 ma ma ma i dd_vlps very-low-power stop mode current at 3.0 v @ 40 to 25?c @ 70?c @ 105?c 93 520 1350 435 2000 4000 ?a ?a ?a i dd_lls low leakage stop mode current at 3.0 v @ 40 to 25?c @ 70?c @ 105?c 4.8 28 126 20 68 270 ?a ?a ?a 9 i dd_vlls3 very low-leakage stop mode 3 current at 3.0 v @ 40 to 25?c @ 70?c @ 105?c 3.1 17 82 8.9 35 148 ?a ?a ?a 9 i dd_vlls2 very low-leakage stop mode 2 current at 3.0 v @ 40 to 25?c @ 70?c @ 105?c 2.2 7.1 41 5.4 12.5 125 ?a ?a ?a i dd_vlls1 very low-leakage stop mode 1 current at 3.0 v @ 40 to 25?c @ 70?c @ 105?c 2.1 6.2 30 7.6 13.5 46 ?a ?a ?a i dd_vbat average current with rtc and 32khz disabled at 3.0 v @ 40 to 25?c @ 70?c @ 105?c 0.33 0.60 1.97 0.39 0.78 2.9 ?a ?a ?a table continues on the next page... general k10 sub-family data sheet data sheet, rev. , 02/201. 1 freescale semiconductor, inc. table 6. power consumption operating behaviors (continued) symbol description min. typ. max. unit notes i dd_vbat average current when cpu is not accessing rtc registers @ 1.8v @ 40 to 25?c @ 70?c @ 105?c @ 3.0v @ 40 to 25?c @ 70?c @ 105?c 0.71 1.01 2.82 0.84 1.17 3.16 0.81 1.3 4.3 0.94 1.5 4.6 ?a ?a ?a ?a ?a ?a 10 1. the analog supply current is the sum of the active or disabled current for each of the analog modules on the device. see each modules specification for its supply current. 2. 100mhz core and system clock, 50mhz bus and flexbus clock, and 25mhz flash clock . mcg configured for fei mode. all peripheral clocks disabled. 3. 100mhz core and system clock, 50mhz bus and flexbus clock, and 25mhz flash clock. mcg configured for fei mode. all peripheral clocks enabled. 4. max values are measured with cpu executing dsp instructions. 5. 25mhz core and system clock, 25mhz bus clock, and 12.5mhz flexbus and flash clock. mcg configured for fei mode. 6. 2 mhz core, system, flexbus, and bus clock and 1mhz flash clock. mcg configured for blpe mode. all peripheral clocks disabled. code executing from flash. 7. 2 mhz core, system, flexbus, and bus clock and 1mhz flash clock. mcg configured for blpe mode. all peripheral clocks enabled but peripherals are not in active operation. code executing from flash. 8. 2 mhz core, system, flexbus, and bus clock and 1mhz flash clock. mcg configured for blpe mode. all peripheral clocks disabled. 9. data reflects devices with 128 kb of ram. 10. includes 32khz oscillator current and rtc operation. 5.2.5.1 diagram: typical idd_run operating behavior the following data was measured under these conditions: ? mcg in fbe mode for 50 mhz and lower frequencies. mcg in fee mode at greater than 50 mhz frequencies. ? no gpios toggled ? code execution from flash with cache enabled ? for the alloff curve, all peripheral clocks are disabled except ftfl general k10 sub-family data sheet data sheet, rev. 7, 02/2013. freescale semiconductor, inc. 17 figure 2. run mode supply current vs. core frequency 5.2.6 emc radiated emissions operating behaviors table 7. emc radiated emissions operating behaviors as measured on 144lqfp and 144mapbga packages symbol description frequency band (mhz) 144lqfp 144mapbga unit notes v re1 radiated emissions voltage, band 1 0.1550 23 12 db?v 1 , 2 v re2 radiated emissions voltage, band 2 50150 27 24 db?v v re3 radiated emissions voltage, band 3 150500 28 27 db?v v re4 radiated emissions voltage, band 4 5001000 14 11 db?v v re_iec iec level 0.151000 k k 2 , 3 1. determined according to iec standard 61967-1, integrated circuits - measurement of electromagnetic emissions, 150 khz to 1 ghz part 1: general conditions and definitions and iec standard 1-2, integrated circuits - measurement of electromagnetic emissions, 150 khz to 1 ghz part 2: measurement of radiated emissionstem cell and wideband tem cell method . measurements were made while the microcontroller was running basic application code. the reported emission level is the value of the maximum measured emission, rounded up to the next whole number, from among the measured orientations in each freuency range. general k10 sub-family data sheet data sheet, rev. , 02/201. 1 freescale semiconductor, inc. 2. v dd = 3.3 v, t a = 25 ?c, f osc = 12 mhz (crystal), f sys = 96 mhz, f bus = 48mhz 3. specified according to annex d of iec standard 61967-2, measurement of radiated emissionstem cell and wideband tem cell method 5.2. designing with radiated emissions in mind to find application notes that provide guidance on designing your system to minimize interference from radiated emissions: 1. go to www.freescale.com . 2. perform a keyword search for emc design. 5.2. capacitance attributes table . capacitance attributes symbol description min. max. unit c in_a input capacitance: analog pins pf c in_d input capacitance: digital pins pf 5. switching specifications 5..1 device clock specifications table . device clock specifications symbol description min. max. unit notes normal run mode f ss system and core clock 100 mhz f bus bus clock 50 mhz fb_clk flexbus clock 50 mhz f flash flash clock 25 mhz f lptmr lptmr clock 25 mhz 5..2 general switching specifications these general purpose specifications apply to all signals configured for gpio, uart, can, cmt, and i 2 c signals. general k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. 1 table 10. general switching specifications symbol description min. max. unit notes gpio pin interrupt pulse width (digital glitch filter disabled) synchronous path 1.5 bus clock cycles 1 , 2 gpio pin interrupt pulse width (digital glitch filter disabled, analog filter enabled) asynchronous path 100 ns 3 gpio pin interrupt pulse width (digital glitch filter disabled, analog filter disabled) asynchronous path 16 ns 3 external reset pulse width (digital glitch filter disabled) 100 ns 3 mode select ( ezp_cs) hold time after reset deassertion 2 bus clock cycles port rise and fall time (high drive strength) slew disabled 1.71 ? v dd ? 2.7v 2.7 ? v dd ? 3.6v slew enabled 1.71 ? v dd ? 2.7v 2.7 ? v dd ? 3.6v 12 6 36 24 ns ns ns ns 4 port rise and fall time (low drive strength) slew disabled 1.71 ? v dd ? 2.7v 2.7 ? v dd ? 3.6v slew enabled 1.71 ? v dd ? 2.7v 2.7 ? v dd ? 3.6v 12 6 36 24 ns ns ns ns 5 1. this is the minimum pulse width that is guaranteed to pass through the pin synchronization circuitry. shorter pulses may or may not be recognized. in stop, vlps, lls, and vllsx modes, the synchronizer is bypassed so shorter pulses can be recognized in that case. 2. the greater synchronous and asynchronous timing must be met. 3. this is the minimum pulse width that is guaranteed to be recognized as a pin interrupt request in stop, vlps, lls, and vllsx modes. 4. 75 pf load 5. 15 pf load 5.4 thermal specifications general k10 sub-family data sheet data sheet, rev. 7, 02/2013. 20 freescale semiconductor, inc. 5.4.1 thermal operating requirements table 11. thermal operating requirements symbol description min. max. unit t j die junction temperature 40 125 ?c t a ambient temperature 40 105 ?c 5.4.2 thermal attributes board type symbol description 100 lqfp unit notes single-layer (1s) r integrated circuits thermal test method environmental conditionsnatural convection (still air) , or eia/jedec standard jesd51-, integrated circuit thermal test method environmental conditionsforced convection (moving air) . 2. determined according to jedec standard jesd51-, integrated circuit thermal test method environmental conditionsjunction-to-board . . determined according to method 1012.1 of mil-std , test method standard, microcircuits , with the cold plate temperature used for the case temperature. the value includes the thermal resistance of the interface material between the top of the package and the cold plate. . determined according to jedec standard jesd51-2, integrated circuits thermal test method environmental conditionsnatural convection (still air) . general k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. 21 6 peripheral operating requirements and behaviors 6.1 core modules 6.1.1 debug trace timing specifications table 12. debug trace operating behaviors symbol description min. max. unit t cyc clock period frequency dependent mhz t wl low pulse width 2 ns t wh high pulse width 2 ns t r clock and data rise time 3 ns t f clock and data fall time 3 ns t s data setup 3 ns t h data hold 2 ns figure 3. trace_clkout specifications th ts ts th trace_clkout trace_d[3:0] figure 4. trace data specifications peripheral operating requirements and behaviors k10 sub-family data sheet data sheet, rev. 7, 02/2013. 22 freescale semiconductor, inc. 6.1.2 jtag electricals table 13. jtag limited voltage range electricals symbol description min. max. unit operating voltage 2.7 3.6 v j1 tclk frequency of operation boundary scan jtag and cjtag serial wire debug 0 0 0 10 25 50 mhz j2 tclk cycle period 1/j1 ns j3 tclk clock pulse width boundary scan jtag and cjtag serial wire debug 50 20 10 ns ns ns j4 tclk rise and fall times 3 ns j5 boundary scan input data setup time to tclk rise 20 ns j6 boundary scan input data hold time after tclk rise 0 ns j7 tclk low to boundary scan output data valid 25 ns j8 tclk low to boundary scan output high-z 25 ns j9 tms, tdi input data setup time to tclk rise 8 ns j10 tms, tdi input data hold time after tclk rise 1 ns j11 tclk low to tdo data valid 17 ns j12 tclk low to tdo high-z 17 ns j13 trst assert time 100 ns j14 trst setup time (negation) to tclk high 8 ns table 14. jtag full voltage range electricals symbol description min. max. unit operating voltage 1.71 3.6 v j1 tclk frequency of operation boundary scan jtag and cjtag serial wire debug 0 0 0 10 20 40 mhz j2 tclk cycle period 1/j1 ns j3 tclk clock pulse width boundary scan jtag and cjtag serial wire debug 50 25 12.5 ns ns ns j4 tclk rise and fall times 3 ns table continues on the next page... peripheral operating reuirements and behaviors k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. 2 table 14. jtag full voltage range electricals (continued) symbol description min. max. unit j5 boundary scan input data setup time to tclk rise 20 ns j6 boundary scan input data hold time after tclk rise 0 ns j7 tclk low to boundary scan output data valid 25 ns j8 tclk low to boundary scan output high-z 25 ns j9 tms, tdi input data setup time to tclk rise 8 ns j10 tms, tdi input data hold time after tclk rise 1.4 ns j11 tclk low to tdo data valid 22.1 ns j12 tclk low to tdo high-z 22.1 ns j13 trst assert time 100 ns j14 trst setup time (negation) to tclk high 8 ns j2 j3 j3 j4 j4 tclk (input) figure 5. test clock input timing j7 j8 j7 j5 j6 input data valid output data valid output data valid tclk data inputs data outputs data outputs data outputs figure 6. boundary scan (jtag) timing peripheral operating requirements and behaviors k10 sub-family data sheet data sheet, rev. 7, 02/2013. 24 freescale semiconductor, inc. j11 j12 j11 j9 j10 input data valid output data valid output data valid tclk tdi/tms tdo tdo tdo figure 7. test access port timing j14 j13 tclk trst figure 8. trst timing 6.2 system modules there are no specifications necessary for the devices system modules. 6.3 clock modules peripheral operating requirements and behaviors k10 sub-family data sheet data sheet, rev. 7, 02/2013. freescale semiconductor, inc. 25 6.3.1 mcg specifications table 15. mcg specifications symbol description min. typ. max. unit notes f ints_ft internal reference frequency (slow clock) factory trimmed at nominal vdd and 25 ?c 32.768 khz f ints_t internal reference frequency (slow clock) user trimmed over fixed voltage and temperature range of 070?c 31.25 38.2 khz table continues on the next page... peripheral operating reuirements and behaviors k10 sub-family data sheet data sheet, rev. , 02/201. 2 freescale semiconductor, inc. table 15. mcg specifications (continued) symbol description min. typ. max. unit notes pll f vco vco operating frequency 48.0 100 mhz i pll pll operating current pll @ 96 mhz (f osc_hi_1 = 8 mhz, f pll_ref = 2 mhz, vdiv multiplier = 48) 1060 a 7 i pll pll operating current pll @ 48 mhz (f osc_hi_1 = 8 mhz, f pll_ref = 2 mhz, vdiv multiplier = 24) 600 a 7 f pll_ref pll reference frequency range 2.0 4.0 mhz j cyc_pll pll period jitter (rms) f vco = 48 mhz f vco = 100 mhz 120 50 ps ps 8 j acc_pll pll accumulated jitter over 1s (rms) f vco = 48 mhz f vco = 100 mhz 1350 600 ps ps 8 d lock lock entry frequency tolerance 1.49 2.98 % d unl lock exit frequency tolerance 4.47 5.97 % t pll_lock lock detector detection time 150 10 -6 + 1075(1/ f pll_ref ) s 9 1. this parameter is measured with the internal reference (slow clock) being used as a reference to the fll (fei clock mode). 2. these typical values listed are with the slow internal reference clock (fei) using factory trim and dmx32=0. 3. the resulting system clock frequencies should not exceed their maximum specified values. the dco frequency deviation ( 6.3.2.1 oscillator dc electrical specifications table 16. oscillator dc electrical specifications symbol description min. typ. max. unit notes v dd supply voltage 1.71 3.6 v i ddosc supply current low-power mode (hgo=0) 32 khz 4 mhz 8 mhz (range=01) 16 mhz 24 mhz 32 mhz 500 200 300 950 1.2 1.5 na ?a ?a ?a ma ma 1 i ddosc supply current high gain mode (hgo=1) 32 khz 4 mhz 8 mhz (range=01) 16 mhz 24 mhz 32 mhz 25 400 500 2.5 3 4 ?a ?a ?a ma ma ma 1 c x extal load capacitance 2 , 3 c y xtal load capacitance 2 , 3 r f feedback resistor low-frequency, low-power mode (hgo=0) m? 2 , 4 feedback resistor low-frequency, high-gain mode (hgo=1) 10 m? feedback resistor high-frequency, low-power mode (hgo=0) m? feedback resistor high-frequency, high-gain mode (hgo=1) 1 m? r s series resistor low-frequency, low-power mode (hgo=0) k? series resistor low-frequency, high-gain mode (hgo=1) 200 k? series resistor high-frequency, low-power mode (hgo=0) k? series resistor high-frequency, high-gain mode (hgo=1) 0 k? table continues on the next page... peripheral operating reuirements and behaviors k10 sub-family data sheet data sheet, rev. , 02/201. 2 freescale semiconductor, inc. table 16. oscillator dc electrical specifications (continued) symbol description min. typ. max. unit notes v pp 5 peak-to-peak amplitude of oscillation (oscillator mode) low-frequency, low-power mode (hgo=0) 0.6 v peak-to-peak amplitude of oscillation (oscillator mode) low-frequency, high-gain mode (hgo=1) v dd v peak-to-peak amplitude of oscillation (oscillator mode) high-frequency, low-power mode (hgo=0) 0.6 v peak-to-peak amplitude of oscillation (oscillator mode) high-frequency, high-gain mode (hgo=1) v dd v 1. v dd =3.3 v, temperature =25 ?c 2. see crystal or resonator manufacturers recommendation 3. c x ,c y can be provided by using either the integrated capacitors or by using external components. 4. when low power mode is selected, r f is integrated and must not be attached externally. 5. the extal and xtal pins should only be connected to required oscillator components and must not be connected to any other devices. 6.3.2.2 oscillator frequency specifications table 17. oscillator frequency specifications symbol description min. typ. max. unit notes f osc_lo oscillator crystal or resonator frequency low frequency mode (mcg_c2[range]=00) 32 40 khz f osc_hi_1 oscillator crystal or resonator frequency high frequency mode (low range) (mcg_c2[range]=01) 3 8 mhz f osc_hi_2 oscillator crystal or resonator frequency high frequency mode (high range) (mcg_c2[range]=1x) 8 32 mhz f ec_extal input clock frequency (external clock mode) 50 mhz 1 , 2 t dc_extal input clock duty cycle (external clock mode) 40 50 60 % t cst crystal startup time 32 khz low-frequency, low-power mode (hgo=0) 750 ms 3 , 4 crystal startup time 32 khz low-frequency, high-gain mode (hgo=1) 250 ms crystal startup time 8 mhz high-frequency (mcg_c2[range]=01), low-power mode (hgo=0) 0.6 ms crystal startup time 8 mhz high-frequency (mcg_c2[range]=01), high-gain mode (hgo=1) 1 ms 1. other frequency limits may apply when external clock is being used as a reference for the fll or pll. 2. when transitioning from fbe to fei mode, restrict the frequency of the input clock so that, when it is divided by frdiv, it remains within the limits of the dco input clock frequency. 3. proper pc board layout procedures must be followed to achieve specifications. peripheral operating requirements and behaviors k10 sub-family data sheet data sheet, rev. 7, 02/2013. freescale semiconductor, inc. 29 4. crystal startup time is defined as the time between the oscillator being enabled and the oscinit bit in the mcg_s register being set. note the 32 khz oscillator works in low power mode by default and cannot be moved into high power/gain mode. 6.3.3 32 khz oscillator electrical characteristics this section describes the module electrical characteristics. 6.3.3.1 32 khz oscillator dc electrical specifications table 18. 32khz oscillator dc electrical specifications symbol description min. typ. max. unit v bat supply voltage 1.71 3.6 v r f internal feedback resistor 100 m? c para parasitical capacitance of extal32 and xtal32 5 7 pf v pp 1 peak-to-peak amplitude of oscillation 0.6 v 1. when a crystal is being used with the 32 khz oscillator, the extal32 and xtal32 pins should only be connected to required oscillator components and must not be connected to any other devices. 6.3.3.2 32 khz oscillator frequency specifications table 19. 32 khz oscillator frequency specifications symbol description min. typ. max. unit notes f osc_lo oscillator crystal 32.768 khz t start crystal start-up time 1000 ms 1 f ec_extal32 externally provided input clock frequency 32.768 khz 2 v ec_extal32 externally provided input clock amplitude 700 v bat mv 2 , 3 1. proper pc board layout procedures must be followed to achieve specifications. 2. this specification is for an externally supplied clock driven to extal32 and does not apply to any other clock input. the oscillator remains enabled and xtal32 must be left unconnected. 3. the parameter specified is a peak-to-peak value and v ih and v il specifications do not apply. the voltage of the applied clock must be within the range of v ss to v bat . 6.4 memories and memory interfaces peripheral operating requirements and behaviors k10 sub-family data sheet data sheet, rev. 7, 02/2013. 30 freescale semiconductor, inc. 6.4.1 flash electrical specifications this section describes the electrical characteristics of the flash memory module. 6.4.1.1 flash timing specifications program and erase the following specifications represent the amount of time the internal charge pumps are active and do not include command overhead. table 20. nvm program/erase timing specifications symbol description min. typ. max. unit notes t hvpgm4 longword program high-voltage time 7.5 18 ?s t hversscr sector erase high-voltage time 13 113 ms 1 t hversblk256k erase block high-voltage time for 256 kb 416 3616 ms 1 1. maximum time based on expectations at cycling end-of-life. 6.4.1.2 flash timing specifications commands table 21. flash command timing specifications symbol description min. typ. max. unit notes t rd1blk256k read 1s block execution time 256 kb program/data flash 1.7 ms t rd1sec2k read 1s section execution time (flash sector) 60 ?s 1 t pgmchk program check execution time 45 ?s 1 t rdrsrc read resource execution time 30 ?s 1 t pgm4 program longword execution time 65 145 ?s t ersblk256k erase flash block execution time 256 kb program/data flash 435 3700 ms 2 t ersscr erase flash sector execution time 14 114 ms 2 t pgmsec512 t pgmsec1k t pgmsec2k program section execution time 512 bytes flash 1 kb flash 2 kb flash 2.4 4.7 9.3 ms ms ms t rd1all read 1s all blocks execution time 1.8 ms t rdonce read once execution time 25 ?s 1 t pgmonce program once execution time 65 ?s t ersall erase all blocks execution time 870 7400 ms 2 t vfykey verify backdoor access key execution time 30 ?s 1 table continues on the next page... peripheral operating reuirements and behaviors k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. 1 table 21. flash command timing specifications (continued) symbol description min. typ. max. unit notes t swapx01 t swapx02 t swapx04 t swapx08 swap control execution time control code 0x01 control code 0x02 control code 0x04 control code 0x08 200 70 70 150 150 30 ?s ?s ?s ?s 1. assumes 25 mhz flash clock frequency. 2. maximum times for erase parameters based on expectations at cycling end-of-life. 6.4.1.3 flash high voltage current behaviors table 22. flash high voltage current behaviors symbol description min. typ. max. unit i dd_pgm average current adder during high voltage flash programming operation 2.5 6.0 ma i dd_ers average current adder during high voltage flash erase operation 1.5 4.0 ma 6.4.1.4 reliability specifications table 23. nvm reliability specifications symbol description min. typ. 1 max. unit notes program flash t nvmretp10k data retention after up to 10 k cycles 5 50 years t nvmretp1k data retention after up to 1 k cycles 20 100 years n nvmcycp cycling endurance 10 k 50 k cycles 2 1. typical data retention values are based on measured response accelerated at high temperature and derated to a constant 25?c use profile. engineering bulletin eb618 does not apply to this technology. typical endurance defined in engineering bulletin eb619. 2. cycling endurance represents number of program/erase cycles at -40?c ? t j ? 125?c. 6.4.2 ezport switching specifications table 24. ezport switching specifications num description min. max. unit operating voltage 1.71 3.6 v ep1 ezp_ck frequency of operation (all commands except read) f sys /2 mhz table continues on the next page... peripheral operating reuirements and behaviors k10 sub-family data sheet data sheet, rev. , 02/201. 2 freescale semiconductor, inc. table 24. ezport switching specifications (continued) num description min. max. unit ep1a ezp_ck frequency of operation (read command) f sys /8 mhz ep2 ezp_cs negation to next ezp_cs assertion 2 x t ezp_ck ns ep3 ezp_cs input valid to ezp_ck high (setup) 5 ns ep4 ezp_ck high to ezp_cs input invalid (hold) 5 ns ep5 ezp_d input valid to ezp_ck high (setup) 2 ns ep6 ezp_ck high to ezp_d input invalid (hold) 5 ns ep7 ezp_ck low to ezp_q output valid 16 ns ep8 ezp_ck low to ezp_q output invalid (hold) 0 ns ep9 ezp_cs negation to ezp_q tri-state 12 ns ep2 ep3 ep4 ep5 ep6 ep7 ep8 ep9 ezp_ck ezp_cs ezp_q (output) ezp_d (input) figure 9. ezport timing diagram 6.4.3 flexbus switching specifications all processor bus timings are synchronous; input setup/hold and output delay are given in respect to the rising edge of a reference clock, fb_clk. the fb_clk frequency may be the same as the internal system bus frequency or an integer divider of that frequency. peripheral operating requirements and behaviors k10 sub-family data sheet data sheet, rev. 7, 02/2013. freescale semiconductor, inc. 33 the following timing numbers indicate when data is latched or driven onto the external bus, relative to the flexbus output clock (fb_clk). all other timing relationships can be derived from these values. table 25. flexbus limited voltage range switching specifications num description min. max. unit notes operating voltage 2.7 3.6 v frequency of operation fb_clk mhz fb1 clock period 20 ns fb2 address, data, and control output valid 11.5 ns 1 fb3 address, data, and control output hold 0.5 ns 1 fb4 data and fb_ta input setup 8.5 ns 2 fb5 data and fb_ta input hold 0.5 ns 2 1. specification is valid for all fb_ad[31:0], fb_be/bwe n , fb_cs n , fb_oe, fb_r/ w, fb_tbst, fb_tsi1:0, fb_ale, and fb_ts. 2. specification is valid for all fb_ad1:0 and fb_ta. table 2. flexbus full voltage range switching specifications num description min. max. unit notes operating voltage 1.1 . v freuency of operation fb_clk mhz fb1 clock period 1/fb_clk ns fb2 address, data, and control output valid 1.5 ns 1 fb address, data, and control output hold 0 ns 1 fb data and fb_ta input setup 1. ns 2 fb5 data and fb_ta input hold 0.5 ns 2 1. specification is valid for all fb_ad1:0, fb_be/bwe n , fb_cs n , fb_oe, fb_r/ w, fb_tbst, fb_tsi1:0, fb_ale, and fb_ts. 2. specification is valid for all fb_ad1:0 and fb_ta. peripheral operating reuirements and behaviors k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. address address data tsiz aa=1 aa=0 aa=1 aa=0 fb1 fb3 fb5 fb4 fb4 fb5 fb2 fb_clk fb_a[y] fb_d[x] fb_rw fb_ts fb_ale fb_csn fb_oen fb_ben fb_ta fb_tsiz[1:0] figure 10. flexbus read timing diagram peripheral operating requirements and behaviors k10 sub-family data sheet data sheet, rev. 7, 02/2013. freescale semiconductor, inc. 35 address address data tsiz aa=1 aa=0 aa=1 aa=0 fb1 fb3 fb4 fb5 fb2 fb_clk fb_a[y] fb_d[x] fb_rw fb_ts fb_ale fb_csn fb_oen fb_ben fb_ta fb_tsiz[1:0] figure 11. flexbus write timing diagram 6.5 security and integrity modules there are no specifications necessary for the devices security and integrity modules. 6.6 analog peripheral operating requirements and behaviors k10 sub-family data sheet data sheet, rev. 7, 02/2013. 36 freescale semiconductor, inc. 6.6.1 adc electrical specifications the 16-bit accuracy specifications listed in table 27 and table 28 are achievable on the differential pins adcx_dp0, adcx_dm0, adcx_dp1, adcx_dm1, adcx_dp3, and adcx_dm3. the adcx_dp2 and adcx_dm2 adc inputs are connected to the pga outputs and are not direct device pins. accuracy specifications for these pins are defined in table 29 and table 30 . all other adc channels meet the 13-bit differential/12-bit single-ended accuracy specifications. 6.6.1.1 16-bit adc operating conditions table 27. 16-bit adc operating conditions symbol description conditions min. typ. 1 max. unit notes v dda supply voltage absolute 1.71 3.6 v table continues on the next page... peripheral operating reuirements and behaviors k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. table 27. 16-bit adc operating conditions (continued) symbol description conditions min. typ. 1 max. unit notes c rate adc conversion rate 16-bit mode no adc hardware averaging continuous conversions enabled, subsequent conversion time 37.037 461.467 ksps 5 1. typical values assume v dda = 3.0 v, temp = 25 ?c, f adck = 1.0 mhz, unless otherwise stated. typical values are for reference only, and are not tested in production. 2. dc potential difference. 3. this resistance is external to mcu. to achieve the best results, the analog source resistance must be kept as low as possible. the results in this data sheet were derived from a system that had < 8 ? analog source resistance. the r as /c as time constant should be kept to < 1 ns. 4. to use the maximum adc conversion clock frequency, the adhsc bit must be set and the adlpc bit must be clear. 5. for guidelines and examples of conversion rate calculation, download the adc calculator tool . r as v as c as z as v adin z adin r adin r adin r adin r adin c adin input pin input pin input pin input pin table continues on the next page... peripheral operating reuirements and behaviors k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. table 28. 16-bit adc characteristics (v refh = v dda , v refl = v ssa ) (continued) symbol description conditions 1 min. typ. 2 max. unit notes f adack adc asynchronous clock source adlpc = 1, adhsc = 0 adlpc = 1, adhsc = 1 adlpc = 0, adhsc = 0 adlpc = 0, adhsc = 1 1.2 2.4 3.0 4.4 2.4 4.0 5.2 6.2 3.9 6.1 7.3 9.5 mhz mhz mhz mhz t adack = 1/ f adack sample time see reference manual chapter for sample times tue total unadjusted error 12-bit modes <12-bit modes 4 1.4 6.8 2.1 lsb 4 5 dnl differential non- linearity 12-bit modes <12-bit modes 0.7 0.2 -1.1 to +1.9 -0.3 to 0.5 lsb 4 5 inl integral non- linearity 12-bit modes <12-bit modes 1.0 0.5 -2.7 to +1.9 -0.7 to +0.5 lsb 4 5 e fs full-scale error 12-bit modes <12-bit modes -4 -1.4 -5.4 -1.8 lsb 4 v adin = v dda 5 e q quantization error 16-bit modes ?13-bit modes -1 to 0 0.5 lsb 4 enob effective number of bits 16-bit differential mode avg = 32 avg = 4 16-bit single-ended mode avg = 32 avg = 4 12.8 11.9 12.2 11.4 14.5 13.8 13.9 13.1 bits bits bits bits 6 sinad signal-to-noise plus distortion see enob 6.02 enob + 1.76 db thd total harmonic distortion 16-bit differential mode avg = 32 16-bit single-ended mode avg = 32 94 -85 db db 7 sfdr spurious free dynamic range 16-bit differential mode avg = 32 16-bit single-ended mode avg = 32 82 78 95 90 db db 7 table continues on the next page... peripheral operating reuirements and behaviors k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. table 28. 16-bit adc characteristics (v refh = v dda , v refl = v ssa ) (continued) symbol description conditions 1 min. typ. 2 max. unit notes e il input leakage error i in r as mv i in = leakage current (refer to the mcus voltage and current operating ratings) temp sensor slope across the full temperature range of the device 1.55 1.62 1.69 mv/?c v temp25 temp sensor voltage 25 ?c 706 716 726 mv 1. all accuracy numbers assume the adc is calibrated with v refh = v dda 2. typical values assume v dda = 3.0 v, temp = 25?c, f adck = 2.0 mhz unless otherwise stated. typical values are for reference only and are not tested in production. 3. the adc supply current depends on the adc conversion clock speed, conversion rate and the adlpc bit (low power). for lowest power operation the adlpc bit must be set, the hsc bit must be clear with 1 mhz adc conversion clock speed. 4. 1 lsb = (v refh - v refl )/2 n 5. adc conversion clock < 16 mhz, max hardware averaging (avge = %1, avgs = %11) 6. input data is 100 hz sine wave. adc conversion clock < 12 mhz. 7. input data is 1 khz sine wave. adc conversion clock < 12 mhz. figure 13. typical enob vs. adc_clk for 16-bit differential mode peripheral operating requirements and behaviors k10 sub-family data sheet data sheet, rev. 7, 02/2013. 40 freescale semiconductor, inc. figure 14. typical enob vs. adc_clk for 16-bit single-ended mode 6.6.1.3 16-bit adc with pga operating conditions table 29. 16-bit adc with pga operating conditions symbol description conditions min. typ. 1 max. unit notes v dda supply voltage absolute 1.71 3.6 v v refpga pga ref voltage vref_ou t vref_ou t vref_ou t v 2 , 3 v adin input voltage v ssa v dda v v cm input common mode range v ssa v dda v r pgad differential input impedance gain = 1, 2, 4, 8 gain = 16, 32 gain = 64 128 64 32 k? in+ to in- 4 r as analog source resistance 100 ? 5 t s adc sampling time 1.25 s 6 table continues on the next page... peripheral operating reuirements and behaviors k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. 1 table 29. 16-bit adc with pga operating conditions (continued) symbol description conditions min. typ. 1 max. unit notes c rate adc conversion rate ? 13 bit modes no adc hardware averaging continuous conversions enabled peripheral clock = 50 mhz 18.484 450 ksps 7 16 bit modes no adc hardware averaging continuous conversions enabled peripheral clock = 50 mhz 37.037 250 ksps 8 1. typical values assume v dda = 3.0 v, temp = 25?c, f adck = 6 mhz unless otherwise stated. typical values are for reference only and are not tested in production. 2. adc must be configured to use the internal voltage reference (vref_out) 3. pga reference is internally connected to the vref_out pin. if the user wishes to drive vref_out with a voltage other than the output of the vref module, the vref module must be disabled. 4. for single ended configurations the input impedance of the driven input is r pgad /2 5. the analog source resistance (r as ), external to mcu, should be kept as minimum as possible. increased r as causes drop in pga gain without affecting other performances. this is not dependent on adc clock frequency. 6. the minimum sampling time is dependent on input signal frequency and adc mode of operation. a minimum of 1.25s time should be allowed for f in =4 khz at 16-bit differential mode. recommended adc setting is: adlsmp=1, adlsts=2 at 8 mhz adc clock. 7. adc clock = 18 mhz, adlsmp = 1, adlst = 00, adhsc = 1 8. adc clock = 12 mhz, adlsmp = 1, adlst = 01, adhsc = 1 6.6.1.4 16-bit adc with pga characteristics table 30. 16-bit adc with pga characteristics symbol description conditions min. typ. 1 max. unit notes i dda_pga supply current low power (adc_pga[pgalpb]=0) 420 644 ?a 2 i dc_pga input dc current a 3 gain =1, v refpga =1.2v, v cm =0.5v 1.54 ?a gain =64, v refpga =1.2v, v cm =0.1v 0.57 ?a table continues on the next page... peripheral operating reuirements and behaviors k10 sub-family data sheet data sheet, rev. , 02/201. 2 freescale semiconductor, inc. table 30. 16-bit adc with pga characteristics (continued) symbol description conditions min. typ. 1 max. unit notes g gain 4 pgag=0 pgag=1 pgag=2 pgag=3 pgag=4 pgag=5 pgag=6 0.95 1.9 3.8 7.6 15.2 30.0 58.8 1 2 4 8 16 31.6 63.3 1.05 2.1 4.2 8.4 16.6 33.2 67.8 r as < 100 table continues on the next page... peripheral operating reuirements and behaviors k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. table 30. 16-bit adc with pga characteristics (continued) symbol description conditions min. typ. 1 max. unit notes enob effective number of bits gain=1, average=4 gain=64, average=4 gain=1, average=32 gain=2, average=32 gain=4, average=32 gain=8, average=32 gain=16, average=32 gain=32, average=32 gain=64, average=32 11.6 7.2 12.8 11.0 7.9 7.3 6.8 6.8 7.5 13.4 9.6 14.5 14.3 13.8 13.1 12.5 11.5 10.6 bits bits bits bits bits bits bits bits bits 16-bit differential mode,f in =100hz sinad signal-to-noise plus distortion ratio see enob 6.02 enob + 1.76 db 1. typical values assume v dda =3.0v, temp=25?c, f adck =6mhz unless otherwise stated. 2. this current is a pga module adder, in addition to adc conversion currents. 3. between in+ and in-. the pga draws a dc current from the input terminals. the magnitude of the dc current is a strong function of input common mode voltage (v cm ) and the pga gain. 4. gain = 2 pgag 5. after changing the pga gain setting, a minimum of 2 adc+pga conversions should be ignored. 6. limit the input signal swing so that the pga does not saturate during operation. input signal swing is dependent on the pga reference voltage and gain setting. 6.6.2 cmp and 6-bit dac electrical specifications table 31. comparator and 6-bit dac electrical specifications symbol description min. typ. max. unit v dd supply voltage 1.71 3.6 v i ddhs supply current, high-speed mode (en=1, pmode=1) 200 ?a i ddls supply current, low-speed mode (en=1, pmode=0) 20 ?a v ain analog input voltage v ss 0.3 v dd v v aio analog input offset voltage 20 mv v h analog comparator hysteresis 1 cr0[hystctr] = 00 cr0[hystctr] = 01 cr0[hystctr] = 10 cr0[hystctr] = 11 5 10 20 30 mv mv mv mv v cmpoh output high v dd 0.5 v v cmpol output low 0.5 v t dhs propagation delay, high-speed mode (en=1, pmode=1) 20 50 200 ns table continues on the next page... peripheral operating reuirements and behaviors k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. table 31. comparator and 6-bit dac electrical specifications (continued) symbol description min. typ. max. unit t dls propagation delay, low-speed mode (en=1, pmode=0) 80 250 600 ns analog comparator initialization delay 2 40 ?s i dac6b 6-bit dac current adder (enabled) 7 ?a inl 6-bit dac integral non-linearity 0.5 0.5 lsb 3 dnl 6-bit dac differential non-linearity 0.3 0.3 lsb 1. typical hysteresis is measured with input voltage range limited to 0.6 to v dd -0.6 v. 2. comparator initialization delay is defined as the time between software writes to change control inputs (writes to dacen, vrsel, psel, msel, vosel) and the comparator output settling to a stable level. 3. 1 lsb = v reference /64 0.04 0.05 0.06 0.07 0.08 p hystereris (v) 00 01 10 hystctr setting 0 0.01 0.02 0.03 0.1 0.4 0.7 1 1.3 1.6 1.9 2.2 2.5 2.8 3.1 cm 10 11 vin level (v) figure 15. typical hysteresis vs. vin level (vdd=3.3v, pmode=0) peripheral operating requirements and behaviors k10 sub-family data sheet data sheet, rev. 7, 02/2013. freescale semiconductor, inc. 45 0 08 0.1 0.12 0.14 0.16 0.18 p hystereris (v) 00 01 10 hystctr setting 0 0.02 0.04 0.06 0.08 0.1 0.4 0.7 1 1.3 1.6 1.9 2.2 2.5 2.8 3.1 cm p 10 11 vin level (v) figure 16. typical hysteresis vs. vin level (vdd=3.3v, pmode=1) 6.6.3 12-bit dac electrical characteristics 6.6.3.1 12-bit dac operating requirements table 32. 12-bit dac operating requirements symbol desciption min. max. unit notes v dda supply voltage 1.71 3.6 v v dacr reference voltage 1.13 3.6 v 1 t a temperature operating temperature range of the device ?c c l output load capacitance 100 pf 2 i l output load current 1 ma 1. the dac reference can be selected to be v dda or the voltage output of the vref module (vref_out) 2. a small load capacitance (47 pf) can improve the bandwidth performance of the dac peripheral operating requirements and behaviors k10 sub-family data sheet data sheet, rev. 7, 02/2013. 46 freescale semiconductor, inc. 6.6.3.2 12-bit dac operating behaviors table 33. 12-bit dac operating behaviors symbol description min. typ. max. unit notes i dda_dacl p supply current low-power mode 150 ?a i dda_dach p supply current high-speed mode 700 ?a t daclp full-scale settling time (0x080 to 0xf7f) low-power mode 100 200 ?s 1 t dachp full-scale settling time (0x080 to 0xf7f) high-power mode 15 30 ?s 1 t ccdaclp code-to-code settling time (0xbf8 to 0xc08) low-power mode and high-speed mode 0.7 1 ?s 1 v dacoutl dac output voltage range low high-speed mode, no load, dac set to 0x000 100 mv v dacouth dac output voltage range high high- speed mode, no load, dac set to 0xfff v dacr ?100 v dacr mv inl integral non-linearity error high speed mode 8 lsb 2 dnl differential non-linearity error v dacr > 2 v 1 lsb 3 dnl differential non-linearity error v dacr = vref_out 1 lsb 4 v offset offset error 0.4 0.8 %fsr 5 e g gain error 0.1 0.6 %fsr 5 psrr power supply rejection ratio, v dda ? 2.4 v 60 90 db t co temperature coefficient offset voltage 3.7 ?v/c 6 t ge temperature coefficient gain error 0.000421 %fsr/c rop output resistance load = 3 k? 250 ? sr slew rate -80h figure 17. typical inl error vs. digital code peripheral operating requirements and behaviors k10 sub-family data sheet data sheet, rev. 7, 02/2013. 48 freescale semiconductor, inc. figure 18. offset at half scale vs. temperature 6.6.4 voltage reference electrical specifications table 34. vref full-range operating requirements symbol description min. max. unit notes v dda supply voltage 1.71 3.6 v t a temperature operating temperature range of the device ?c c l output load capacitance 100 nf 1 , 2 1. c l must be connected to vref_out if the vref_out functionality is being used for either an internal or external reference. 2. the load capacitance should not exceed +/-25% of the nominal specified c l value over the operating temperature range of the device. peripheral operating requirements and behaviors k10 sub-family data sheet data sheet, rev. 7, 02/2013. freescale semiconductor, inc. 49 table 35. vref full-range operating behaviors symbol description min. typ. max. unit notes v out voltage reference output with factory trim at nominal v dda and temperature=25c 1.1915 1.195 1.1977 v v out voltage reference output factory trim 1.1584 1.2376 v v step voltage reference trim step 0.5 mv v tdrift temperature drift (vmax -vmin across the full temperature range) 80 mv i bg bandgap only current 80 a 1 i lp low-power buffer current 360 ua 1 i hp high-power buffer current 1 ma 1 6.8.1 can switching specifications see general switching specifications . 6.8.2 dspi switching specifications (limited voltage range) the dma serial peripheral interface (dspi) provides a synchronous serial bus with master and slave operations. many of the transfer attributes are programmable. the tables below provide dspi timing characteristics for classic spi timing modes. refer to the dspi chapter of the reference manual for information on the modified transfer formats used for communicating with slower peripheral devices. table 38. master mode dspi timing (limited voltage range) num description min. max. unit notes operating voltage 2.7 3.6 v frequency of operation 25 mhz ds1 dspi_sck output cycle time 2 x t bus ns ds2 dspi_sck output high/low time (t sck /2) ? 2 (t sck /2) + 2 ns ds3 dspi_pcs n valid to dspi_sck delay (t bus x 2) 2 ns 1 ds dspi_sck to dspi_pcs n invalid delay (t bus x 2) 2 ns 2 ds5 dspi_sck to dspi_sout valid .5 ns ds dspi_sck to dspi_sout invalid 2 ns ds dspi_sin to dspi_sck input setup 15 ns ds dspi_sck to dspi_sin input hold 0 ns 1. the delay is programmable in spix_ctarnpssck and spix_ctarncssck. 2. the delay is programmable in spix_ctarnpasc and spix_ctarnasc. ds ds ds1 ds2 ds ds first data last data ds5 first data data last data ds data dspi_pcsn dspi_sck (cpol0) dspi_sin dspi_sout figure 1. dspi classic spi timing master mode peripheral operating reuirements and behaviors k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. 51 table 39. slave mode dspi timing (limited voltage range) num description min. max. unit operating voltage 2.7 3.6 v frequency of operation 12.5 mhz ds9 dspi_sck input cycle time 4 x t bus ns ds10 dspi_sck input high/low time (t sck /2) ? 2 (t sck /2) + 2 ns ds11 dspi_sck to dspi_sout valid 10 ns ds12 dspi_sck to dspi_sout invalid 0 ns ds13 dspi_sin to dspi_sck input setup 2 ns ds14 dspi_sck to dspi_sin input hold 7 ns ds15 dspi_ss active to dspi_sout driven 14 ns ds16 dspi_ss inactive to dspi_sout not driven 14 ns first data last data first data data last data data ds15 ds10 ds9 ds16 ds11 ds12 ds14 ds13 dspi_ss dspi_sck (cpol=0) dspi_sout dspi_sin figure 20. dspi classic spi timing slave mode 6.8.3 dspi switching specifications (full voltage range) the dma serial peripheral interface (dspi) provides a synchronous serial bus with master and slave operations. many of the transfer attributes are programmable. the tables below provides dspi timing characteristics for classic spi timing modes. refer to the dspi chapter of the reference manual for information on the modified transfer formats used for communicating with slower peripheral devices. table 40. master mode dspi timing (full voltage range) num description min. max. unit notes operating voltage 1.71 3.6 v 1 frequency of operation 12.5 mhz ds1 dspi_sck output cycle time 4 x t bus ns table continues on the next page... peripheral operating reuirements and behaviors k10 sub-family data sheet data sheet, rev. , 02/201. 52 freescale semiconductor, inc. table 40. master mode dspi timing (full voltage range) (continued) num description min. max. unit notes ds2 dspi_sck output high/low time (t sck /2) - 4 (t sck/2) + 4 ns ds3 dspi_pcs n valid to dspi_sck delay (t bus x 2) ns 2 ds dspi_sck to dspi_pcs n invalid delay (t bus x 2) ns ds5 dspi_sck to dspi_sout valid 10 ns ds dspi_sck to dspi_sout invalid -.5 ns ds dspi_sin to dspi_sck input setup 20.5 ns ds dspi_sck to dspi_sin input hold 0 ns 1. the dspi module can operate across the entire operating voltage for the processor, but to run across the full voltage range the maximum freuency of operation is reduced. 2. the delay is programmable in spix_ctarnpssck and spix_ctarncssck. . the delay is programmable in spix_ctarnpasc and spix_ctarnasc. ds ds ds1 ds2 ds ds first data last data ds5 first data data last data ds data dspi_pcsn dspi_sck (cpol0) dspi_sin dspi_sout figure 21. dspi classic spi timing master mode table 1. slave mode dspi timing (full voltage range) num description min. max. unit operating voltage 1.1 . v freuency of operation .25 mhz ds dspi_sck input cycle time x t bus ns ds10 dspi_sck input high/low time (t sck /2) - (t sck/2) ns ds11 dspi_sck to dspi_sout valid 20 ns ds12 dspi_sck to dspi_sout invalid 0 ns ds1 dspi_sin to dspi_sck input setup 2 ns ds1 dspi_sck to dspi_sin input hold ns ds15 dspi_ss active to dspi_sout driven 1 ns ds1 dspi_ss inactive to dspi_sout not driven 1 ns peripheral operating reuirements and behaviors k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. 5 first data last data first data data last data data ds15 ds10 ds9 ds16 ds11 ds12 ds14 ds13 dspi_ss dspi_sck (cpol=0) dspi_sout dspi_sin figure 22. dspi classic spi timing slave mode 6.8.4 inter-integrated circuit interface (i 2 c) timing table 42. i 2 c timing characteristic symbol standard mode fast mode unit minimum maximum minimum maximum scl clock frequency f scl 0 100 0 400 khz hold time (repeated) start condition. after this period, the first clock pulse is generated. t hd ; sta 4 0.6 s low period of the scl clock t low 4.7 1.3 s high period of the scl clock t high 4 0.6 s set-up time for a repeated start condition t su ; sta 4.7 0.6 s data hold time for i 2 c bus devices t hd ; dat 0 1 3.45 2 0 3 0.9 1 s data set-up time t su ; dat 250 4 100 2 , 5 ns rise time of sda and scl signals t r 1000 20 +0.1c b 6 300 ns fall time of sda and scl signals t f 300 20 +0.1c b 5 300 ns set-up time for stop condition t su ; sto 4 0.6 s bus free time between stop and start condition t buf 4.7 1.3 s pulse width of spikes that must be suppressed by the input filter t sp n/a n/a 0 50 ns 1. the master mode i 2 c deasserts ack of an address byte simultaneously with the falling edge of scl. if no slaves acknowledge this address byte, then a negative hold time can result, depending on the edge rates of the sda and scl lines. 2. the maximum thd; dat must be met only if the device does not stretch the low period (tlow) of the scl signal. 3. input signal slew = 10ns and output load = 50pf 4. set-up time in slave-transmitter mode is 1 ipbus clock period, if the tx fifo is empty. 5. a fast mode i 2 c bus device can be used in a standard mode i2c bus system, but the requirement t su; dat ? 250 ns must then be met. this is automatically the case if the device does not stretch the low period of the scl signal. if such a device does stretch the low period of the scl signal, then it must output the next data bit to the sda line t rmax + t su; dat = 1000 + 250 = 1250 ns (according to the standard mode i 2 c bus specification) before the scl line is released. peripheral operating requirements and behaviors k10 sub-family data sheet data sheet, rev. 7, 02/2013. 54 freescale semiconductor, inc. 6. c b = total capacitance of the one bus line in pf. ? ? sd2sd3 sd1 sd6 sd8 sd7 sdhc_clk output sdhc_cmd output sdhc_dat[3:0] input sdhc_cmd input sdhc_dat[3:0] figure 24. sdhc timing 6.8.7 i 2 s switching specifications this section provides the ac timings for the i 2 s in master (clocks driven) and slave modes (clocks input). all timings are given for non-inverted serial clock polarity (tcr[tsckp] = 0, rcr[rsckp] = 0) and a non-inverted frame sync (tcr[tfsi] = 0, rcr[rfsi] = 0). if the polarity of the clock and/or the frame sync have been inverted, all the timings remain valid by inverting the clock signal (i2s_bclk) and/or the frame sync (i2s_fs) shown in the figures below. table 44. i 2 s master mode timing (limited voltage range) num description min. max. unit operating voltage 2.7 3.6 v s1 i2s_mclk cycle time 2 x t sys ns s2 i2s_mclk pulse width high/low 45% 55% mclk period s3 i2s_bclk cycle time 5 x t sys ns s4 i2s_bclk pulse width high/low 45% 55% bclk period s5 i2s_bclk to i2s_fs output valid 15 ns s6 i2s_bclk to i2s_fs output invalid -2.5 ns s7 i2s_bclk to i2s_txd valid 15 ns s8 i2s_bclk to i2s_txd invalid -3 ns s9 i2s_rxd/i2s_fs input setup before i2s_bclk 20 ns s10 i2s_rxd/i2s_fs input hold after i2s_bclk 0 ns peripheral operating requirements and behaviors k10 sub-family data sheet data sheet, rev. 7, 02/2013. 56 freescale semiconductor, inc. s1 s2 s2 s3 s4 s4 s5 s9 s7 s9 s10 s7 s8 s6 s10 s8 i2s_mclk (output) i2s_bclk (output) i2s_fs (output) i2s_fs (input) i2s_txd i2s_rxd figure 25. i 2 s timing master mode table 45. i 2 s slave mode timing (limited voltage range) num description min. max. unit operating voltage 2.7 3.6 v s11 i2s_bclk cycle time (input) 8 x t sys ns s12 i2s_bclk pulse width high/low (input) 45% 55% mclk period s13 i2s_fs input setup before i2s_bclk 10 ns s14 i2s_fs input hold after i2s_bclk 3 ns s15 i2s_bclk to i2s_txd/i2s_fs output valid 20 ns s16 i2s_bclk to i2s_txd/i2s_fs output invalid 0 ns s17 i2s_rxd setup before i2s_bclk 10 ns s18 i2s_rxd hold after i2s_bclk 2 ns peripheral operating requirements and behaviors k10 sub-family data sheet data sheet, rev. 7, 02/2013. freescale semiconductor, inc. 57 s15 s13 s15 s17 s18 s15 s16 s16 s14 s16 s11 s12 s12 i2s_bclk (input) i2s_fs (output) i2s_fs (input) i2s_txd i2s_rxd figure 26. i 2 s timing slave modes table 46. i 2 s master mode timing (full voltage range) num description min. max. unit operating voltage 1.71 3.6 v s1 i2s_mclk cycle time 2 x t sys ns s2 i2s_mclk pulse width high/low 45% 55% mclk period s3 i2s_bclk cycle time 5 x t sys ns s4 i2s_bclk pulse width high/low 45% 55% bclk period s5 i2s_bclk to i2s_fs output valid 15 ns s6 i2s_bclk to i2s_fs output invalid -4.3 ns s7 i2s_bclk to i2s_txd valid 15 ns s8 i2s_bclk to i2s_txd invalid -4.6 ns s9 i2s_rxd/i2s_fs input setup before i2s_bclk 23.9 ns s10 i2s_rxd/i2s_fs input hold after i2s_bclk 0 ns table 47. i 2 s slave mode timing (full voltage range) num description min. max. unit operating voltage 1.71 3.6 v s11 i2s_bclk cycle time (input) 8 x t sys ns s12 i2s_bclk pulse width high/low (input) 45% 55% mclk period s13 i2s_fs input setup before i2s_bclk 10 ns s14 i2s_fs input hold after i2s_bclk 3.5 ns s15 i2s_bclk to i2s_txd/i2s_fs output valid 28.6 ns s16 i2s_bclk to i2s_txd/i2s_fs output invalid 0 ns s17 i2s_rxd setup before i2s_bclk 10 ns s18 i2s_rxd hold after i2s_bclk 2 ns peripheral operating requirements and behaviors k10 sub-family data sheet data sheet, rev. 7, 02/2013. 58 freescale semiconductor, inc. 6.9 human-machine interfaces (hmi) 6.9.1 tsi electrical specifications table 48. tsi electrical specifications symbol description min. typ. max. unit notes v ddtsi operating voltage 1.71 3.6 v c ele target electrode capacitance range 1 20 500 pf 1 f refmax reference oscillator frequency 5.5 12.7 mhz 2 f elemax electrode oscillator frequency 0.5 4.0 mhz 3 c ref internal reference capacitor 0.5 1 1.2 pf v delta oscillator delta voltage 100 600 760 mv 4 i ref reference oscillator current source base current 1ua setting (refchrg=0) 32ua setting (refchrg=31) 1.133 36 1.5 50 ?a 3 , 5 i ele electrode oscillator current source base current 1ua setting (extchrg=0) 32ua setting (extchrg=31) 1.133 36 1.5 50 ?a 3 , 6 pres5 electrode capacitance measurement precision 8.3333 38400 ff/count 7 pres20 electrode capacitance measurement precision 8.3333 38400 ff/count 8 pres100 electrode capacitance measurement precision 8.3333 38400 ff/count 9 maxsens maximum sensitivity 0.003 12.5 ff/count 10 res resolution 16 bits t con20 response time @ 20 pf 8 15 25 ?s 11 i tsi_run current added in run mode 55 ?a i tsi_lp low power mode current adder 1.3 2.5 ?a 12 1. the tsi module is functional with capacitance values outside this range. however, optimal performance is not guaranteed. 2. captrm=7, delvol=7, and fixed external capacitance of 20 pf. 3. captrm=0, delvol=2, and fixed external capacitance of 20 pf. 4. captrm=0, extchrg=9, and fixed external capacitance of 20 pf. 5. the programmable current source value is generated by multiplying the scanc[refchrg] value and the base current. 6. the programmable current source value is generated by multiplying the scanc[extchrg] value and the base current. 7. measured with a 5 pf electrode, reference oscillator frequency of 10 mhz, ps = 128, nscn = 8; iext = 16. 8. measured with a 20 pf electrode, reference oscillator frequency of 10 mhz, ps = 128, nscn = 2; iext = 16. 9. measured with a 20 pf electrode, reference oscillator frequency of 10 mhz, ps = 16, nscn = 3; iext = 16. 10. sensitivity defines the minimum capacitance change when a single count from the tsi module changes, it is equal to (c ref * i ext )/( i ref * ps * nscn). sensitivity depends on the configuration used. the typical value listed is based on the following configuration: iext = 5 ?a, extchrg = 4, ps = 128, nscn = 2, i ref = 16 = 1 = 32 7 dimensions 7.1 obtaining package dimensions package dimensions are provided in package drawings. to find a package drawing, go to freescale.com and perform a keyword search for the drawing?s document number: if you want the drawing for this package then use this document number 100-pin lqfp 98ass23308w 8 pinout 8.1 k10 signal multiplexing and pin assignments the following table shows the signals available on each pin and the locations of these pins on the devices supported by this document. the port control module is responsible for selecting which alt functionality is available on each pin. 100 lqfp pin name default alt0 alt1 alt2 alt3 alt4 alt5 alt6 alt7 ezport 1 pte0 adc1_se4a adc1_se4a pte0 spi1_pcs1 uart1_tx sdhc0_d1 i2c1_sda 2 pte1/ llwu_p0 adc1_se5a adc1_se5a pte1/ llwu_p0 spi1_sout uart1_rx sdhc0_d0 i2c1_scl 3 pte2/ llwu_p1 adc1_se6a adc1_se6a pte2/ llwu_p1 spi1_sck uart1_cts_b sdhc0_dclk 4 pte3 adc1_se7a adc1_se7a pte3 spi1_sin uart1_rts_b sdhc0_cmd 5 pte4/ llwu_p2 disabled pte4/ llwu_p2 spi1_pcs0 uart3_tx sdhc0_d3 6 pte5 disabled pte5 spi1_pcs2 uart3_rx sdhc0_d2 7 pte6 disabled pte6 spi1_pcs3 uart3_cts_b i2s0_mclk i2s0_clkin 8 vdd vdd vdd 9 vss vss vss 10 pte16 adc0_se4a adc0_se4a pte16 spi0_pcs0 uart2_tx ftm_clkin0 ftm0_flt3 11 pte17 adc0_se5a adc0_se5a pte17 spi0_sck uart2_rx ftm_clkin1 lpt0_alt3 12 pte18 adc0_se6a adc0_se6a pte18 spi0_sout uart2_cts_b i2c0_sda 13 pte19 adc0_se7a adc0_se7a pte19 spi0_sin uart2_rts_b i2c0_scl dimensions k10 sub-family data sheet data sheet, rev. 7, 02/2013. 60 freescale semiconductor, inc. 100 lqfp pin name default alt0 alt1 alt2 alt3 alt4 alt5 alt6 alt7 ezport 14 adc0_dp1 adc0_dp1 adc0_dp1 15 adc0_dm1 adc0_dm1 adc0_dm1 16 adc1_dp1 adc1_dp1 adc1_dp1 17 adc1_dm1 adc1_dm1 adc1_dm1 18 pga0_dp/ adc0_dp0/ adc1_dp3 pga0_dp/ adc0_dp0/ adc1_dp3 pga0_dp/ adc0_dp0/ adc1_dp3 19 pga0_dm/ adc0_dm0/ adc1_dm3 pga0_dm/ adc0_dm0/ adc1_dm3 pga0_dm/ adc0_dm0/ adc1_dm3 20 pga1_dp/ adc1_dp0/ adc0_dp3 pga1_dp/ adc1_dp0/ adc0_dp3 pga1_dp/ adc1_dp0/ adc0_dp3 21 pga1_dm/ adc1_dm0/ adc0_dm3 pga1_dm/ adc1_dm0/ adc0_dm3 pga1_dm/ adc1_dm0/ adc0_dm3 22 vdda vdda vdda 23 vrefh vrefh vrefh 24 vrefl vrefl vrefl 25 vssa vssa vssa 26 vref_out/ cmp1_in5/ cmp0_in5/ adc1_se18 vref_out/ cmp1_in5/ cmp0_in5/ adc1_se18 vref_out/ cmp1_in5/ cmp0_in5/ adc1_se18 27 dac0_out/ cmp1_in3/ adc0_se23 dac0_out/ cmp1_in3/ adc0_se23 dac0_out/ cmp1_in3/ adc0_se23 28 xtal32 xtal32 xtal32 29 extal32 extal32 extal32 30 vbat vbat vbat 31 pte24 adc0_se17 adc0_se17 pte24 can1_tx uart4_tx ewm_out_b 32 pte25 adc0_se18 adc0_se18 pte25 can1_rx uart4_rx ewm_in 33 pte26 disabled pte26 uart4_cts_b rtc_clkout 34 pta0 jtag_tclk/ swd_clk/ ezp_clk tsi0_ch1 pta0 uart0_cts_b ftm0_ch5 jtag_tclk/ swd_clk ezp_clk 35 pta1 jtag_tdi/ ezp_di tsi0_ch2 pta1 uart0_rx ftm0_ch6 jtag_tdi ezp_di 36 pta2 jtag_tdo/ trace_swo/ ezp_do tsi0_ch3 pta2 uart0_tx ftm0_ch7 jtag_tdo/ trace_swo ezp_do 37 pta3 jtag_tms/ swd_dio tsi0_ch4 pta3 uart0_rts_b ftm0_ch0 jtag_tms/ swd_dio 38 pta4/ llwu_p3 nmi_b/ ezp_cs_b tsi0_ch5 pta4/ llwu_p3 ftm0_ch1 nmi_b ezp_cs_b 39 pta5 disabled pta5 ftm0_ch2 cmp2_out i2s0_rx_bclk jtag_trst 40 vdd vdd vdd pinout k10 sub-family data sheet data sheet, rev. 7, 02/2013. freescale semiconductor, inc. 61 100 lqfp pin name default alt0 alt1 alt2 alt3 alt4 alt5 alt6 alt7 ezport 41 vss vss vss 42 pta12 cmp2_in0 cmp2_in0 pta12 can0_tx ftm1_ch0 i2s0_txd ftm1_qd_ pha 43 pta13/ llwu_p4 cmp2_in1 cmp2_in1 pta13/ llwu_p4 can0_rx ftm1_ch1 i2s0_tx_fs ftm1_qd_ phb 44 pta14 disabled pta14 spi0_pcs0 uart0_tx i2s0_tx_bclk 45 pta15 disabled pta15 spi0_sck uart0_rx i2s0_rxd 46 pta16 disabled pta16 spi0_sout uart0_cts_b i2s0_rx_fs 47 pta17 adc1_se17 adc1_se17 pta17 spi0_sin uart0_rts_b i2s0_mclk i2s0_clkin 48 vdd vdd vdd 49 vss vss vss 50 pta18 extal extal pta18 ftm0_flt2 ftm_clkin0 51 pta19 xtal xtal pta19 ftm1_flt0 ftm_clkin1 lpt0_alt1 52 reset_b reset_b reset_b 53 ptb0/ llwu_p5 adc0_se8/ adc1_se8/ tsi0_ch0 adc0_se8/ adc1_se8/ tsi0_ch0 ptb0/ llwu_p5 i2c0_scl ftm1_ch0 ftm1_qd_ pha 54 ptb1 adc0_se9/ adc1_se9/ tsi0_ch6 adc0_se9/ adc1_se9/ tsi0_ch6 ptb1 i2c0_sda ftm1_ch1 ftm1_qd_ phb 55 ptb2 adc0_se12/ tsi0_ch7 adc0_se12/ tsi0_ch7 ptb2 i2c0_scl uart0_rts_b ftm0_flt3 56 ptb3 adc0_se13/ tsi0_ch8 adc0_se13/ tsi0_ch8 ptb3 i2c0_sda uart0_cts_b ftm0_flt0 57 ptb9 ptb9 spi1_pcs1 uart3_cts_b fb_ad20 58 ptb10 adc1_se14 adc1_se14 ptb10 spi1_pcs0 uart3_rx fb_ad19 ftm0_flt1 59 ptb11 adc1_se15 adc1_se15 ptb11 spi1_sck uart3_tx fb_ad18 ftm0_flt2 60 vss vss vss 61 vdd vdd vdd 62 ptb16 tsi0_ch9 tsi0_ch9 ptb16 spi1_sout uart0_rx fb_ad17 ewm_in 63 ptb17 tsi0_ch10 tsi0_ch10 ptb17 spi1_sin uart0_tx fb_ad16 ewm_out_b 64 ptb18 tsi0_ch11 tsi0_ch11 ptb18 can0_tx ftm2_ch0 i2s0_tx_bclk fb_ad15 ftm2_qd_ pha 65 ptb19 tsi0_ch12 tsi0_ch12 ptb19 can0_rx ftm2_ch1 i2s0_tx_fs fb_oe_b ftm2_qd_ phb 66 ptb20 ptb20 spi2_pcs0 fb_ad31 cmp0_out 67 ptb21 ptb21 spi2_sck fb_ad30 cmp1_out 68 ptb22 ptb22 spi2_sout fb_ad29 cmp2_out 69 ptb23 ptb23 spi2_sin spi0_pcs5 fb_ad28 70 ptc0 adc0_se14/ tsi0_ch13 adc0_se14/ tsi0_ch13 ptc0 spi0_pcs4 pdb0_extrg i2s0_txd fb_ad14 71 ptc1/ llwu_p6 adc0_se15/ tsi0_ch14 adc0_se15/ tsi0_ch14 ptc1/ llwu_p6 spi0_pcs3 uart1_rts_b ftm0_ch0 fb_ad13 pinout k10 sub-family data sheet data sheet, rev. 7, 02/2013. 62 freescale semiconductor, inc. 100 lqfp pin name default alt0 alt1 alt2 alt3 alt4 alt5 alt6 alt7 ezport 72 ptc2 adc0_se4b/ cmp1_in0/ tsi0_ch15 adc0_se4b/ cmp1_in0/ tsi0_ch15 ptc2 spi0_pcs2 uart1_cts_b ftm0_ch1 fb_ad12 73 ptc3/ llwu_p7 cmp1_in1 cmp1_in1 ptc3/ llwu_p7 spi0_pcs1 uart1_rx ftm0_ch2 fb_clkout 74 vss vss vss 75 vdd vdd vdd 76 ptc4/ llwu_p8 ptc4/ llwu_p8 spi0_pcs0 uart1_tx ftm0_ch3 fb_ad11 cmp1_out 77 ptc5/ llwu_p9 ptc5/ llwu_p9 spi0_sck lpt0_alt2 fb_ad10 cmp0_out 78 ptc6/ llwu_p10 cmp0_in0 cmp0_in0 ptc6/ llwu_p10 spi0_sout pdb0_extrg fb_ad9 79 ptc7 cmp0_in1 cmp0_in1 ptc7 spi0_sin fb_ad8 80 ptc8 adc1_se4b/ cmp0_in2 adc1_se4b/ cmp0_in2 ptc8 i2s0_mclk i2s0_clkin fb_ad7 81 ptc9 adc1_se5b/ cmp0_in3 adc1_se5b/ cmp0_in3 ptc9 i2s0_rx_bclk fb_ad6 ftm2_flt0 82 ptc10 adc1_se6b/ cmp0_in4 adc1_se6b/ cmp0_in4 ptc10 i2c1_scl i2s0_rx_fs fb_ad5 83 ptc11/ llwu_p11 adc1_se7b adc1_se7b ptc11/ llwu_p11 i2c1_sda i2s0_rxd fb_rw_b 84 ptc12 ptc12 uart4_rts_b fb_ad27 85 ptc13 ptc13 uart4_cts_b fb_ad26 86 ptc14 ptc14 uart4_rx fb_ad25 87 ptc15 ptc15 uart4_tx fb_ad24 88 vss vss vss 89 vdd vdd vdd 90 ptc16 ptc16 can1_rx uart3_rx fb_cs5_b/ fb_tsiz1/ fb_be23_16_b 91 ptc17 ptc17 can1_tx uart3_tx fb_cs4_b/ fb_tsiz0/ fb_be31_24_b 92 ptc18 ptc18 uart3_rts_b fb_tbst_b/ fb_cs2_b/ fb_be15_8_b 93 ptd0/ llwu_p12 ptd0/ llwu_p12 spi0_pcs0 uart2_rts_b fb_ale/ fb_cs1_b/ fb_ts_b 94 ptd1 adc0_se5b adc0_se5b ptd1 spi0_sck uart2_cts_b fb_cs0_b 95 ptd2/ llwu_p13 ptd2/ llwu_p13 spi0_sout uart2_rx fb_ad4 96 ptd3 ptd3 spi0_sin uart2_tx fb_ad3 97 ptd4/ llwu_p14 ptd4/ llwu_p14 spi0_pcs1 uart0_rts_b ftm0_ch4 fb_ad2 ewm_in 98 ptd5 adc0_se6b adc0_se6b ptd5 spi0_pcs2 uart0_cts_b ftm0_ch5 fb_ad1 ewm_out_b pinout k10 sub-family data sheet data sheet, rev. 7, 02/2013. freescale semiconductor, inc. 63 100 lqfp pin name default alt0 alt1 alt2 alt3 alt4 alt5 alt6 alt7 ezport 99 ptd6/ llwu_p15 adc0_se7b adc0_se7b ptd6/ llwu_p15 spi0_pcs3 uart0_rx ftm0_ch6 fb_ad0 ftm0_flt0 100 ptd7 ptd7 cmt_iro uart0_tx ftm0_ch7 ftm0_flt1 8.2 k10 pinouts the below figure shows the pinout diagram for the devices supported by this document. many signals may be multiplexed onto a single pin. to determine what signals can be used on which pin, see the previous section. pinout k10 sub-family data sheet data sheet, rev. 7, 02/2013. 64 freescale semiconductor, inc. 60 59 58 57 56 55 54 53 52 51 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 pga1_dp/adc1_dp0/adc0_dp3 pga0_dm/adc0_dm0/adc1_dm3 pga0_dp/adc0_dp0/adc1_dp3 adc1_dm1 adc1_dp1 adc0_dm1 adc0_dp1 pte19 pte18 pte17 pte16 vss vdd pte6 pte5 pte4 pte3 pte2 pte1 pte0 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 vdd vss ptc3 ptc2 ptc1 ptc0 ptb23 ptb22 ptb21 ptb20 ptb19 ptb18 ptb17 ptb16 vdd vss ptb11 ptb10 ptb9 ptb3 ptb2 ptb1 ptb0 reset_b pta19 25 24 23 22 21 vssa vrefl vrefh vdda pga1_dm/adc1_dm0/adc0_dm3 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 99 79 78 77 76 ptd6 ptc7 ptc6 ptc5 ptc4 50 49 48 47 46 45 44 43 42 41 pta18 vss vdd pta17 pta16 pta15 pta14 pta13 pta12 vss vdd pta5 pta4 pta3 pta2 pta1 pta0 pte26 pte25 pte24 vbat extal32 xtal32 dac0_out/ cmp1_in3/adc0_se23 vref_out/cmp1_in5/ cmp0_in5/adc1_se18 98 ptd5 97 ptd4 96 ptd3 95 ptd2 94 ptd1 93 ptd0 92 ptc18 91 ptc17 90 ptc16 89 vdd 88 vss 80 ptc8 ptc9 ptc10 81 82 83 ptc11 84 ptc12 85 ptc13 86 ptc14 87 ptc15 100 ptd7 figure 27. k10 100 lqfp pinout diagram 9 revision history the following table provides a revision history for this document. table 49. revision history rev. no. date substantial changes 1 11/2010 initial public revision 2 3/2011 many updates throughout table continues on the next page... revision history k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. 5 table 49. revision history (continued) rev. no. date substantial changes 3 3/2011 added sections that were inadvertently removed in previous revision 4 3/2011 reworded i ic footnote in "voltage and current operating requirements" table. added paragraph to "peripheral operating requirements and behaviors" section. added "jtag full voltage range electricals" table to the "jtag electricals" section. 5 6/2011 changed supported part numbers per new part number scheme changed dc injection current specs in voltage and current operating reuirements table changed input leakage current and internal pullup/pulldown resistor specs in voltage and current operating behaviors table split low power stop mode current specs by temperature range in power consumption operating behaviors table changed typical i dd_vbat spec in power consumption operating behaviors table added lptmr clock specs to device clock specifications table changed minimum external reset pulse width in general switching specifications table changed pll operating current in mcg specifications table added footnote to pll period jitter in mcg specifications table changed supply current in oscillator dc electrical specifications table changed crystal startup time in oscillator freuency specifications table changed operating voltage in ezport switching specifications table changed title of flexbus switching specifications table and added output valid and hold specs added flexbus full range switching specifications table changed adc asynchronous clock source specs in 1-bit adc characteristics table changed gain spec in 1-bit adc with pga characteristics table added typical input dc current to 1-bit adc with pga characteristics table changed input offset voltage and enob notes field in 1-bit adc with pga characteristics table changed analog comparator initialization delay in comparator and -bit dac electrical specifications changed code-to-code settling time , dac output voltage range low , and temperature coefficient offset voltage in 12-bit dac operating behaviors table changed temperature drift and load regulation in vref full-range operating behaviors table changed dspi_sck cycle time specs in dspi timing tables changed dspi_ss specs in slave mode dspi timing (low-speed mode) table changed dspi_sck to dspi_sout valid spec in slave mode dspi timing (high- speed mode) table changed reference oscillator current source base current spec and added low-power current adder footer in tsi electrical specifications table 01/2012 added ac electrical specifications. replaced tbds with silicon data throughout. in power mode transition operating behaviors table, removed entry times. updated emc radiated emissions operating behaviors to remove sae level and also added data for 1lfp. clarified ep in ezport switching specifications table and ezport timing diagram. added enob vs. adc_clk for 1-bit differential and 1-bit single-ended modes figures. updated i dd_run numbers in power consumption operating behaviors section. clarified diagram: typical idd_run operating behavior section and updated run mode supply current vs. core freuency all peripheral clocks disabled figure. in voltage reference electrical specifications section, updated c l , v tdrift , and v vdrift values. table continues on the next page... revision history k10 sub-family data sheet data sheet, rev. , 02/201. freescale semiconductor, inc. table 49. revision history (continued) rev. no. date substantial changes 7 02/2013 in "esd handling ratings", added a note for i lat . updated "voltage and current operating requirements". updated "voltage and current operating behaviors". updated "power mode transition operating behaviors". updated "emc radiated emissions operating behaviors" to add mapbga data. in "mcg specifications", updated the description of f ints_t . in "16-bit adc operating conditions", updated the max spec of v adin . in "16-bit adc electrical characteristics", updated the temp sensor slope and voltage specs. updated "i2c switching specifications". in "sdhc specifications", removed the operating voltage limits and updated the sd1 and sd6 specs. in "i2s switching specifications", added separate specification tables for the full operating voltage range. revision history k10 sub-family data sheet data sheet, rev. 7, 02/2013. freescale semiconductor, inc. 67 how to reach us: hoe ae: wwweescaeco e ot: htt:wwweescaecosot uoe o ocatos ot ste: eescae ecocto echca oato ete ast ot roa ee oa o wwweescaecosot oe e ast a ca: eescae haete etscha h echca oato ete chatoe eche ea sh sh ea ech wwweescaecosot aa: eescae ecocto aa t heaates r owe hoeo eo oo aa o sotaaeescaeco saacc: eescae ecocto ha t chae o ao roa haoa stct e ha sotasaeescaeco ocet e: re oato ths ocet s oe soe to eae sste a sotwae eetes to se eescae ecoctos octs hee ae o eess o e coht ceses ate heee to es o acate a teate ccts o teate ccts ase o the oato ths ocet eescae ecocto esees the ht to ae chaes wthot the otce to a octs hee eescae ecocto aes o waat eesetato o aatee ea the stat o ts octs o a atca ose o oes eescae ecocto asse a at as ot o the acato o se o a oct o cct a secca scas a at c wthot tato coseeta o ceta aaes ca aaetes that a e oe eescae ecocto ata sheets ao seccatos ca a o a eet acatos a acta eoace a a oe te oeat aaetes c cas st e aate o each cstoe acato cstoes techca eets eescae ecocto oes ot coe a cese e ts atet hts o the hts o othes eescae ecocto octs ae ot ese tee o athoe o se as cooets sstes tee o sca at to the o o othe acatos tee to sot o ssta e o o a othe acato whch ae o the eescae ecocto oct co ceate a stato whee esoa o eath a occ ho e chase o se eescae ecocto octs o a sch tee o athoe acato e sha e eescae ecocto a ts oces eoees ssaes aates a sttos haess aast a cas costs aaes a eeses a easoae attoe ees as ot o ect o ect a ca o esoa o eath assocate wth sch tee o athoe se ee sch cas aees that eescae ecocto was eet ea the es o aacte o the at rohcoat ao ee esos o eescae octs hae the ctoat a eectca chaactestcs as the orohcoat ao oee coteats o the oato see htt:wwweescaeco o cotact o eescae saes eesetate o oato o eescaes oeta octs oa o to htt:wwweescaecoe eescae a the eescae oo ae taeas o eescae ecocto c othe oct o sece aes ae the oet o the esecte owes eescae 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